Our product portfolio comprises a range of versatile time-to-digital converters (TDC) and analog-to-digital converters (ADC). Many of our customers' applications rely on time-of-flight (TOF) measurements. Our PC boards are ideally suited for use in mass spectrometry (TOF-MS) and LIDAR Systems, Optical Coherence Tomography (OCT), Fluorescence Lifetime Imaging Microscopy (FLIM), Time Correlated Single Photon Counting (TCSPC), Near Infrared Spectroscopy (NIRS), Functional Near Infrared Spectroscopy (fNIRS) and others.
Our multi-hit capable TDCs perform measurements of pulse arrival times at highest precision. Our ADCs provide additional analog pulse shape information as, for example, pulse height, width and area, and allow for detailed pulse shape analysis to disentangle single-pulse contribution in scenarios of overlapping pulses. Many of our boards can be linked and synchronized for high channel count applications. Our Ndigo Crates may house up to 8 PCIe boards in an external casing in such settings.
Our platform-based approach allows us to quickly customize products for OEM customers that need additional features for their systems.