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current Subject:

bin size, jitter and RMS

How are bin size, jitter and RMS error related?

cronologic answer:

The bin size, jitter, and RMS measurement error are all important parameters that play a role in the digital acquisition of time data.

  • The bin size refers to the width of the time windows into which the data is divided during the measurement. The smaller the bin size, the higher the temporal resolution of the measurement. However, if the bin size is too large, there may be an overlap of data between each time window, resulting in an inaccurate measurement.
  • Jitter refers to the deviation in the time it takes for data to arrive at each time window. When jitter is high, data in a circuit can be erratic or inconsistent, resulting in an inaccurate measurement. Jitter is not directly related to bin size and therefore cannot be calculated directly from it. Jitter can be considered as the measure of the temporal variability of the acquired signal edges.
  • The RMS measurement error refers to the average deviation between the actual values of the input data and the values generated by the measurement. The lower the RMS measurement error, the more accurate the measurement.